帕克精密科技有限公司

經營理念

致力發展AFM於各大領域的應用，讓使用者能藉由AFM量測而得知樣品的表面形貌與特性的表現。 Park Systems Corporation is a leading provider of nanoscale microscopy and metrology solutions. Its comprehensive product range includes atomic force microscopy (AFM), white light interferometry (WLI), nanoscale IR spectrometers (AFM-IR), imaging spectroscopic ellipsometry (ISE), active vibration isolation (AVI), and digital holographic microscope (DHM) systems. The company's commitment to innovation has led to groundbreaking technologies like Non-contact™ imaging, 3D metrology, and fully automated AFM systems, serving both research and industrial applications. These solutions are widely used in scientific research, nanoscale engineering, semiconductor fabrication, display technology, advanced packaging, and quality assurance. Park Systems' dedication to excellence has made it the preferred choice for nano-metrology products among leading semiconductor companies, top-tier research universities, and national labs.