About TESCAN GROUP TESCAN was established in 1991 and has grown from a 5-engineer start-up initially to a company with 800 employees working in 11 countries. We are a leading player in charged-particle optical instrumentation, including Scanning and Scanning Transmission Electron Microscopy (SEM & STEM), Focused Ion Beam (FIB) and X-ray Computed Tomography (micro-CT), with nearly 4500 instruments sold and operational in more than 80 countries. In 2013, it expanded by merging with ORSAY PHYSICS, a French global leader in customized focused ion and electron beam technologies, and in 2018 by acquiring XRE, a Belgian innovator in the field of Dynamic and micro-CT technologies. A further, more recent milestone was the acquisition in 2023 of TESCAN ORSAY HOLDING and all its subsidiaries by CARLYLE, a US private equity company. In 2024, TESCAN Group successfully acquired the business of EXpressLO LLC through an asset deal, including its patents. Other significant milestones in 2024 included the acquisition of TESCAN KOREA, Ltd. (TKL) and Daeil Microanalysis Laboratory (DML), as well as the announcement of the establishment of new subsidiaries: TESCAN Taiwan and TESCAN Singapore. TESCAN GROUP is headquartered in Brno, Czech Republic, where most of our instruments are expertly assembled, tested, and shipped to customers across the globe.
提供電子顯微鏡、聚焦離子束、X-ray 與光譜分析設備,以及完整供應與售後服務 1. 電子顯微鏡系列 4D-STEM:TENSOR 透射電子顯微鏡 — 材料分析、半導體故障分析 SEM:VEGA4 掃描式電子顯微鏡 — 生命科學、材料分析 FE-SEM:MIRA / CLARA / MAGUNA 場發射掃描式電子顯微鏡 — 生命科學、材料分析、半導體故障分析 (支援 12 吋晶圓) 2. 聚焦離子束系列 Dual Beam FIB:Amber / Solaris 雙束聚焦離子束 — 生命科學、材料分析、半導體故障分析 (支援 12 吋晶圓) Dual Beam Plasma FIB:Amber X / Solaris X 雙束電漿聚焦離子束 — 材料分析、半導體故障分析 (支援 12 吋晶圓) 3. 特殊解決方案 TIMA / MIRA AMU / RISE — 礦物分析、超大型 SEM 樣品艙、SEM-拉曼光譜整合 4. X-ray 與微影像分析 Micro CT:CoreTOM / DynaTOM / UniTOM — 4D X-ray 微型內部結構分析,支援時間軸動態研究 5. 光譜與晶體分析 EDS/EDX 能量散射 X-ray 分析 WDS/WDX 波長散射 X-ray 分析 EBSD 電子背散射繞射晶構分析 TOF-SIMS 飛行時間二次離子質譜分析