薪資可談
Responsibilities
● Ensure new products meet product development requirements with respect to product specification, quality and reliability benchmarks and manufacturability
● Define NPI and production test plans, DoEs for product performance study
● Analyze test and characterization data to benchmark performance specifications
● Drive failure analysis studies to root cause fail modes/mechanisms to improve yield and quality metrics
● Partnering with the ATE, Bench and SLT Test teams for test program definition, test hardware specification and vector generation guidelines
● New products DPPM correlation and performance correlation between system and ATE
● Support product sustaining activities for yield improvement, lot disposition, test time reduction and RMA management
Minimum Qualifications (MQs)
●Required: Bachelor's, Electrical Engineering and/or Computer Engineering
● At least 10 years in the semiconductor industry
● Experience with Yield & Fail Pareto Analysis using JMP (preferred), Exensio, Datapower orO+.
● IC qualification, data review, production release, System Level Testing, test time reduction and yield improvement
Preferred Qualifications (PQs)
● Academic or 7+ years Industry Experience in the following areas is preferred:VLSI technologies - Product & Test Engineering, Semiconductor processing
● Familiarity with test chip design, development and testing methodologies is a plus
● Solid understanding of reliability stress, device qualification and associated processes
● Familiar with advanced packaging such as 2.5d, 3d, InFo
● Familiar with process technology, and how it relates to design and testing Data analysis:wafer sort, final test
● Familiarity with Automatic Test Equipment (ATE) test platforms such as Advantest 93K ,Teradyne UltraFlex SOC test system
● SERDES, PCIe, DDR and Mixed-Signal circuits such as ADC, DAC, PLL, LDO and their performance measurements.
● Strong foundations in Test and Design for test (DFT) techniques. Familiarity with structural tests such as Scan/ATPG, JTAG, Memory BIST and sensors such as PVT/temperature/current/droop sensors, etc
